DocumentCode
3343733
Title
Adhesive Failure of Micro-Cantilever Beams
Author
Fan, Kangqi ; Jia, Jianyuan ; Zhu, Yingmin
Author_Institution
Sch. of Mech. & Electr. Eng., Xidian Univ., Shaanxi
fYear
2006
fDate
13-16 Aug. 2006
Firstpage
1
Lastpage
5
Abstract
One of the most important reliability problems in micro-electromechanical systems (MEMS) is the adhesion of contacting surfaces due to surface forces. Based on the Hamaker hypotheses and the van der Waals interactions of atoms, the adhesive energy and force of sphere-plane are obtained. Employing the deformation theory of micro-cantilever beams, the variations of the elastic energy and force with the deflection of micro-cantilever beams are achieved. With the adhesive energy of sphere-plane and the variation of the elastic energy with the deflection of a micro-cantilever beam, a failure parameter is introduced to estimate the reliability and stability of a randomly given micro-cantilever beam. The micro-cantilever is reliable and stable only if the failure parameter zeta > 1. The simulation results indicate that the failure parameter zeta is valid and reliable in estimating the reliability and stability of a randomly given micro-cantilever beam with a contact pad fixed on its free end
Keywords
adhesion; beams (structures); cantilevers; micromechanical devices; van der Waals forces; Hamaker hypotheses; MEMS; adhesive failure; deformation theory; elastic energy; microcantilever beams; microelectromechanical systems; van der Waals interactions; Accelerometers; Adhesives; Electrical engineering; Electrostatics; Microelectromechanical devices; Microelectromechanical systems; Micromechanical devices; Shape; Stability; Structural beams;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechatronic and Embedded Systems and Applications, Proceedings of the 2nd IEEE/ASME International Conference on
Conference_Location
Beijing
Print_ISBN
0-7803-9721-5
Type
conf
DOI
10.1109/MESA.2006.296992
Filename
4077819
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