DocumentCode :
3343954
Title :
Life-time characteristics of EPR cable insulation under electrical and thermal stresses
Author :
Cao, L. ; Grzybowski, S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Mississippi State Univ., Starkville, MS, USA
fYear :
2013
fDate :
June 30 2013-July 4 2013
Firstpage :
632
Lastpage :
635
Abstract :
Ethylene Propylene Rubber (EPR) has been used as the insulation for polymeric power cables for its good dielectric properties. For the typical medium voltage EPR cables, the designing electrical stress should not exceed 5 kV/mm under normal operational conditions. The majority of the EPR cables have a maximum working temperature of 105 °C with the capability of working at 140 °C for short-time period. Since the occasional over-voltage and over-current will accelerate the aging, it will be necessary to determine the life-time characteristics under the combined high electrical and thermal stress. In the study, EPR cable insulation samples of 90 μm thick were sliced from the commercial-available 15 kV EPR cable. Constant ac voltage was applied to the cable samples while the test temperature was kept at 105 °C, 140 °C, 165 °C, and 190 °C accordingly. The time-to-breakdown data were collected to extrapolate the lifetime characteristics of the tested EPR insulation samples.
Keywords :
ageing; dielectric properties; electric breakdown; ethylene-propylene rubber; power cable insulation; reliability; thermal stresses; EPR cable insulation; constant AC voltage; dielectric properties; electrical stress design; ethylene propylene rubber; life-time characteristics; maximum working temperature; normal operational condition; polymeric power cable insulation; short-time period; size 90 mum; temperature 105 degC; temperature 140 degC; temperature 165 degC; temperature 190 degC; test temperature; thermal stress; time-to-breakdown data; typical medium voltage EPR cables; voltage 15 kV; Aging; Cable insulation; Materials; Power cables; Stress; Thermal stresses; Aging; EPR; Electrical Stress; Thermal Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location :
Bologna
ISSN :
2159-1687
Print_ISBN :
978-1-4799-0807-3
Type :
conf
DOI :
10.1109/ICSD.2013.6619873
Filename :
6619873
Link To Document :
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