DocumentCode
3343992
Title
Reactive ion etching surface texturing of c-Si using silica nanosphere lithography technique for solar cell application
Author
Choi, Joo-Young ; Honsberg, Christiana B.
Author_Institution
Arizona State Univ., Tempe, AZ, USA
fYear
2013
fDate
16-21 June 2013
Firstpage
1199
Lastpage
1202
Abstract
A reactive ion etching (RIE) process has been applied to etch diverse shape of nanoscale surface texturing on crystalline silicon (c-Si) for solar cell application. In this work, silica nanospheres (NS) were used as a mask material to utilize selective etching between silicon surface and silica NS for texturing. For effective silica NS deposition, we also developed our own solvent-control spin-coating method showing great monolayer coverage under common laboratory environment which is possibly more suitable for low-cost fabrication compared to conventional approach (moisture and temperature controlled spin-coating or dipping coating method by Langmuir-Blodgett trough). In RIE process, the surface texturing was etched with various shapes to reduce the reflectivity from surface, and the spectral response measurement confirms the effectiveness of RIE texturing which showed phenomenal anti-reflection effect with less than 2% of light reflection below 1.0 um wavelength. In addition, experiments for Quinhydrone/Methanol (QHY/ME) surface passivation for RIE textured surface were proceeded to evaluate RIE texturing effect for surface recombination velocity and minority carrier lifetime.
Keywords
monolayers; nanolithography; passivation; reflectivity; silicon; silicon compounds; solar cells; spin coating; sputter etching; surface texture; Langmuir-Blodgett trough; QHY-ME passivation; RIE process; RIE texturing effect evaluation; Si; SiO2; dipping coating method; effective silica NS deposition; low-cost fabrication; mask material; minority carrier lifetime; moisture spin-coating; nanoscale surface texture; phenomenal antireflection effect; quinhydrone-methanol surface passivation; reactive ion etching process; reflectivity; silica NS; silica nanosphere lithography technique; solar cell application; solvent-control spin-coating method; spectral response measurement; surface recombination velocity; temperature controlled spin-coating; Decision support systems; Etching; Lithography; Photovoltaic cells; Silicon compounds; Surface texture; Reactive ion etching; Silica nanospheres; Surface texturing; mono-crystalline silicon; surface passivation;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location
Tampa, FL
Type
conf
DOI
10.1109/PVSC.2013.6744355
Filename
6744355
Link To Document