• DocumentCode
    3344124
  • Title

    Investigations on the origin of the darkfield signal in X-Ray Talbot interferometry

  • Author

    Ritter, Andre ; Bayer, Florian ; Durst, Jürgen ; Gödel, Karl ; Haas, Wilhelm ; Michel, Thilo ; Weber, Thomas ; Anton, Gisela

  • Author_Institution
    ECAP - Novel Detectors, Univ. of Erlangen, Erlangen, Germany
  • fYear
    2011
  • fDate
    23-29 Oct. 2011
  • Firstpage
    2314
  • Lastpage
    2315
  • Abstract
    Recently, darkfield imaging has been established as third imaging technique in X-Ray Talbot interferometry. The darkfield image shows the reduction of visibilities of the interferometer relative to the visibilities gained in reference measurements. The information perceivable from darkfield images can be different from what is observable in absorption and phase images. While the image formation for the absorption and phase image is widely understood, this is not the case for the darkfield signal. There are several attempts for an explanation. To pursue these explanations and, moreover, to get a comprehensive understanding of the darkfield image formation, an investigation based on simulations is carried out. These simulations include wave field propagation as well as Monte Carlo codes. The results suggest that small angle scattering and the micro structure of an object can not be the exclusive origins of the dark field signal. At least diffraction effects at steep edges and possibly visibility changes due to beam hardening effects also have to be accounted for.
  • Keywords
    Monte Carlo methods; Talbot effect; X-ray apparatus; X-ray imaging; absorption; image reconstruction; interferometry; Monte Carlo code; X-ray talbot interferometry; absorption image; angle scattering; beam hardening effect; darkfield image formation; darkfield signal; diffraction effect; image formation; image reconstruction; microstructure analysis; phase image; ISO standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
  • Conference_Location
    Valencia
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-0118-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2011.6153870
  • Filename
    6153870