• DocumentCode
    3344528
  • Title

    Exciton fine structures and spin relaxation in semiconductor quantum dots

  • Author

    Takagahara, T.

  • Author_Institution
    NTT Basic Res. Labs., Kanagawa, Japan
  • fYear
    1992
  • fDate
    23-28 May 1992
  • Firstpage
    47
  • Lastpage
    48
  • Abstract
    Summary form only given. Recently, the /spl mu/-photoluminescence spectroscopy or near-field scanning optical microscopy revealed polarization-dependent doublet structures of excitons with fine splitting of about several tens of /spl mu/eV as well as a very narrow linewidth of the same order of magnitude. A localized exciton at a monolayer-high island in narrow quantum wells (QWs) can be regarded as a weakly confined quantum dot (QD)-like state. It was found that the interface of a QW has island-like structures elongated along the [1~10] direction. The photoluminescence (PL) and PL excitation spectra show a fine splitting between two polarized components along [110] and [1~10] directions.
  • Keywords
    excitons; fine structure; island structure; monolayers; optical microscopy; photoluminescence; semiconductor quantum dots; /spl mu/-photoluminescence spectroscopy; PL excitation spectra; [1~10] direction; exciton double fine line splitting; exciton fine structures; fine splitting; island-like structures; localized exciton; monolayer-high island; near-field scanning optical microscopy; photoluminescence; polarization-dependent doublet structures; polarized components; semiconductor quantum dots; spin relaxation; very narrow linewidth; weakly confined quantum dot; Excitons; Magnetic field measurement; Magnetic fields; Magnetic resonance; Nonlinear optics; Polarization; Quantum dots; Shape; US Department of Transportation; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    1-55752-576-X
  • Type

    conf

  • DOI
    10.1109/QELS.1999.807154
  • Filename
    807154