Title :
Ozone correction for AM0 calibrated solar cells for the aircraft method
Author :
Snyder, David B. ; Scheiman, David A. ; Jenkins, Phillip P. ; Rieke, William J. ; Blankenship, Kurt S.
Author_Institution :
NASA Glenn Res. Center, Cleveland, OH, USA
Abstract :
The aircraft solar cell calibration method has provided cells calibrated to space conditions for 37 years. However, it is susceptible to systematic errors due to ozone concentrations in the stratosphere. The present correction procedure applies a 1% increase to the measured Isc values. High band-gap cells are more sensitive to ozone absorbed wavelengths (0.4 to 0.8 μm) so it becomes important to reassess the correction technique. This paper evaluates the ozone correction to be 1+O3×Fo, where O3 is the total ozone along the optical path, and Fo is 29.8×10-6/du for a silicon solar cell, 42.6×10-6/du for a GaAs cell and 57.2×10-6/d.u. for a InGaP cell. These correction factors work best to correct data points obtained during the flight rather than as a correction to the final result.
Keywords :
III-V semiconductors; calibration; elemental semiconductors; gallium arsenide; indium compounds; ozone; silicon; solar cells; 0.4 to 0.8 micron; AM0 calibrated solar cells; GaAs; GaAs cell; InGaP; InGaP cell; O3; Si; aircraft method; high band-gap cells; ozone correction; silicon solar cell; space conditions; Aircraft; Atmospheric measurements; Calibration; Gallium arsenide; NASA; Optical sensors; Photonic band gap; Photovoltaic cells; Silicon; Terrestrial atmosphere;
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
Print_ISBN :
0-7803-7471-1
DOI :
10.1109/PVSC.2002.1190706