• DocumentCode
    3344669
  • Title

    Exploring the Relationship of a File´s History and Its Fault-Proneness: An Empirical Study

  • Author

    Illes-Seifert, Timea ; Paech, Barbara

  • Author_Institution
    Inst. for Comput. Sci., Univ. of Heidelberg, Heidelberg
  • fYear
    2008
  • fDate
    29-31 Aug. 2008
  • Firstpage
    13
  • Lastpage
    22
  • Abstract
    Knowing which particular characteristics of software are indicators for defects is very valuable for testers in order to allocate testing resources appropriately. In this paper, we present the results of an empirical study exploring the relationship between history characteristics of files and their defect count. We analyzed nine open source Java projects across different versions in order to answer the following questions: 1)Do past defects correlate with a filepsilas current defect count? 2) Do late changes correlate with a filepsilas defect count? 3) Is the file´s age a good indicator for its defect count? The results are partly surprising. Only 4 of 9 programs show moderate correlation between a file´s defects in previous and in current releases in more than the half of analysed releases. In contrast to our expectations, the oldest files represent the most fault-prone files. Additionally, late changes influence filepsilas defect count only partly.
  • Keywords
    Java; configuration management; program testing; project management; public domain software; software fault tolerance; software maintenance; software quality; defect correlation; fault-prone file; file defect count; open source Java project management; software maintenance; software quality; software testing; versioning control; Computer industry; Computer science; Control systems; History; Industrial relations; Java; Resource management; Software measurement; Software quality; Software testing; correlation analysis; empirical study; fault-proneness; software history;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Practice and Research Techniques, 2008. TAIC PART '08. Testing: Academic & Industrial Conference
  • Conference_Location
    Windsor
  • Print_ISBN
    978-0-7695-3383-4
  • Type

    conf

  • DOI
    10.1109/TAIC-PART.2008.16
  • Filename
    4670296