• DocumentCode
    3344853
  • Title

    160Gb/s Serial Line Rates in a Monolithic Optoelectronic Multistage Interconnection Network

  • Author

    Albores-Mejia, A. ; Williams, K.A. ; Gomez-Agis, F. ; Zhang, S. ; Dorren, H.J.S. ; Leijtens, X.J.M. ; de Vries, T. ; Oei, Y.S. ; Heck, M.J.R. ; Augustin, L.M. ; Notzel, R. ; Robbins, D.J. ; Smit, M.K.

  • fYear
    2009
  • fDate
    25-27 Aug. 2009
  • Firstpage
    157
  • Lastpage
    162
  • Abstract
    We demonstrate very high line rate serial 160 Gb/s data transmission through a semiconductor optical amplifier based multistage switching matrix. This represents both the leading edge in monolithic switching circuit complexity and the highest reported line rates through monolithically cascaded switching networks. Bit error rate studies are performed to show only modest levels of signal degradation. Power penalties of order 0.6 dB and 1.2 dB are observed for two stages and four stages respectively in the monolithic circuits at 160 Gb/s per path.
  • Keywords
    error statistics; integrated optoelectronics; monolithic integrated circuits; optical interconnections; optical switches; semiconductor optical amplifiers; switching networks; SOA-based multistage switching matrix; bit rate 160 Gbit/s; integrated optoelectronics; modest signal degradation level; monolithic optoelectronic multistage interconnection network; monolithic switching circuit complexity; monolithically cascaded switching networks; optical switches; semiconductor optical amplifier; very-high line rate serial data transmission; Bandwidth; Energy consumption; Integrated circuit interconnections; Multiprocessor interconnection networks; Optical fiber networks; Optical waveguides; Optical wavelength conversion; Semiconductor optical amplifiers; Switching circuits; Transceivers; Integrated optoelectronics; optical switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Interconnects, 2009. HOTI 2009. 17th IEEE Symposium on
  • Conference_Location
    New York, NY
  • ISSN
    1550-4794
  • Print_ISBN
    978-0-7695-3847-1
  • Electronic_ISBN
    1550-4794
  • Type

    conf

  • DOI
    10.1109/HOTI.2009.10
  • Filename
    5238669