• DocumentCode
    3344943
  • Title

    On the potential of the AMSR-E based Polarization Ratio Variation Index (PRVI) for soil wetness variations monitoring

  • Author

    Lacava, T. ; Coviello, I. ; Mazzeo, G. ; Pergola, N. ; Tramutoli, V.

  • Author_Institution
    Inst. of Methodologies for Environ. Anal. (IMAA), Nat. Res. Council, Italy, Tito Scalo, Italy
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    4415
  • Lastpage
    4418
  • Abstract
    Monitoring soil moisture dynamics, both in space and time, is important for understanding soil-vegetation-atmosphere interactions. Several operational satellite sensors could be used for monitoring soil moisture variations on a global scale. In this context, in this paper we investigated the potential of the Advanced Microwave Scanning Radiometer on Earth Observing System (AMSR-E), analyzing soil wetness variations occurred in Central Europe during the August 2002 flood, by means of the recently proposed Polarization Ratio Variation Index (PRVI). In detail, thanks to the good spectral resolution of AMSR-E as well to its capability to achieve dual measurements in all channels, four PRVIs have been computed. Results of the inter-comparison among them will be shown and discussed in this paper, also by using the standard AMSR-E soil moisture products daily provided by NASA.
  • Keywords
    floods; hydrological techniques; microwave measurement; moisture measurement; radiometry; remote sensing; soil; AD 2002 08; AMSR-E; Advanced Microwave Scanning Radiometer; Central Europe; Earth Observing System; Polarization Ratio Variation Index; flood; operational satellite sensors; soil moisture dynamics monitoring; soil wetness variation monitoring; soil-vegetation-atmosphere interaction; spectral resolution; Correlation; Floods; Moisture measurement; Satellites; Soil measurements; Soil moisture; AMSR-E; PRVI; RST; soil moisture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5652110
  • Filename
    5652110