DocumentCode :
3344954
Title :
Multiresolution despeckling of VHR SAR images based on MRF segmentation
Author :
Alparone, L. ; Argenti, F. ; Bianchi, T. ; Abbate, M. ; D´Elia, C. ; Mariano, P. ; Meta, A.
Author_Institution :
Dept. Electron. & Telecommun., Univ. of Florence, Florence, Italy
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
288
Lastpage :
291
Abstract :
In this work, maximum a posteriori (MAP) despeckling, implemented in the multiresolution domain defined by the undecimated discrete wavelet transform (UDWT), will carried out on very high resolution (VHR) SAR images and compared with earlier multiresolution approaches developed by the authors. The MAP solution in UDWT domain has been specialized to SAR imagery. Every UDWT subband is segmented into statistically homogeneous segments and one generalized Gaussian (GG) PDF (variance and shape factor) is estimated for each segment. This solution allows to effectively handle scene heterogeneity as imaged by the VHR SAR system. Segmentation exploits a Tree Structured Markov Random Field (TSMRF), which is a low complexity MRF segmentation that allows the estimation of the number of segments and the segmentation itself to be carried out at same time. Experiments performed on a single-look VHR X-band SAR images demonstrate that the segmented approach is effective whenever the classical circular Gaussian model of complex reflectivity may no longer hold.
Keywords :
Gaussian processes; Markov processes; discrete wavelet transforms; image resolution; image segmentation; maximum likelihood estimation; radar imaging; synthetic aperture radar; tree data structures; MRF segmentation; Markov random field; SAR images; UDWT; VHR images; classical circular Gaussian model; maximum a posteriori; multiresolution despeckling; tree structure; undecimated discrete wavelet transform; very high resolution; Estimation; Image resolution; Image segmentation; Mathematical model; Speckle; Wavelet domain; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
ISSN :
2153-6996
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
Type :
conf
DOI :
10.1109/IGARSS.2010.5652111
Filename :
5652111
Link To Document :
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