Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime

Author

Blum, Adrienne L. ; Swirhun, James S. ; Sinton, Ronald A. ; Fei Yan ; Herasimenka, Stanislau ; Roth, T. ; Lauer, K. ; Haunschild, Jonas ; Lim, B. ; Bothe, Klaus ; Hameiri, Ziv ; Seipel, Bjoern ; Rentian Xiong ; Dhamrin, Marwan ; Murphy, John D.

Author_Institution

Sinton Instrum., Boulder, CO, USA

fYear

2013

fDate

16-21 June 2013

Firstpage

1396

Lastpage

1401

Abstract

Excess-carrier recombination lifetime is a key parameter in silicon solar cell design and production. With the vast international use and recent standardization (SEMI PV13) of eddy-current wafer and brick silicon lifetime test instruments, it is important to quantify the inter- and intra-laboratory repeatability. This paper presents results of an international inter-laboratory study conducted with 24 participants to determine the precision of the SEMI PV13 eddy-current carrier lifetime measurement test method. Overall, the carrier recombination lifetime between-laboratory reproducibility was found to be within ±11% for quasi-steady-state (QSS) mode and ±8% for transient mode for wafer samples and within ±4% for bulk samples.

Keywords

electron-hole recombination; elemental semiconductors; silicon; solar cells; standardisation; SEMI PV13 eddy-current carrier lifetime measurement test method; brick silicon lifetime test instruments; eddy-current wafer; excess-carrier recombination lifetime; quasisteady-state mode; silicon solar cell design; Atmospheric measurements; Electrical resistance measurement; Instruments; Laboratories; Particle measurements; Standards; Transient analysis; charge carrier lifetime; eddy currents; photoconductivity; silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th

Conference_Location

Tampa, FL

Type

conf

DOI

10.1109/PVSC.2013.6744405

Filename

6744405