• DocumentCode
    334507
  • Title

    Time-domain free-space evaluations of urethane slabs with finite-difference time-domain computer simulations

  • Author

    Johnk, Robert T. ; Ondrejka, Arthur R. ; Holloway, Christopher L.

  • Author_Institution
    Electromagn. Fields Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    24-28 Aug 1998
  • Firstpage
    290
  • Abstract
    This paper describes the extraction of electrical material properties of lossy, carbon-doped urethane slabs using a free-space time-domain reflectivity measurement system developed by the National Institute of Standards and Technology. In order to validate the measurement results. The measurement system was simulated using the finite-difference time-domain method. Reflectivity measurement results and theoretical predictions as a function of carbon-doping, frequency, and angle of incidence are presented. Excellent agreement is obtained between measured and simulated results. Finally, complex permittivity results are presented for two urethane slabs with different carbon-doping levels, and the dispersion is a strong function of the amount of carbon
  • Keywords
    absorbing media; carbon; dielectric materials; digital simulation; electrical engineering computing; finite difference time-domain analysis; permittivity measurement; reflectivity; National Institute of Standards and Technology; angle of incidence; carbon-doping; complex permittivity results; dispersion; finite-difference time-domain computer simulations; free-space time-domain reflectivity measurement; lossy carbon-doped urethane slabs; reflectivity measurement; time-domain free-space evaluation; urethane slabs; Electric variables measurement; Finite difference methods; Frequency measurement; Loss measurement; Material properties; NIST; Permittivity measurement; Reflectivity; Slabs; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-5015-4
  • Type

    conf

  • DOI
    10.1109/ISEMC.1998.750103
  • Filename
    750103