Title :
Noise sensor flip-flop
Author :
Tsukagoshi, Tsuneo ; Nitta, Shuichi ; Mutoh, Atsuo ; Kaneko, Shigeru
Author_Institution :
NEC Corp., Kawasaki, Japan
Abstract :
In order to attain safety in the case of digital system upset due to noise, a device to detect the digital system´s malfunction due to noise is demanded. This paper describes the design method of a noise sensor flip-flop with asymmetrical noise immunity characteristics. These characteristics mean that noise immunity of Q:H→L due to noise is different from that of Q:L→H due to noise. It is shown that this function is realized by using that the overriding factor of one transistor of output Q being different from another
Keywords :
digital systems; electric noise measurement; electric sensing devices; flip-flops; asymmetrical noise immunity characteristics; digital system upset; digital system´s malfunction detection; noise sensor flip-flop; safety; transistor; Agriculture; Circuit noise; Design methodology; Digital systems; Flip-flops; Integrated circuit noise; National electric code; Noise figure; Power supplies; Sensor phenomena and characterization;
Conference_Titel :
Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-5015-4
DOI :
10.1109/ISEMC.1998.750108
