DocumentCode :
334517
Title :
High field strength in a large volume: the extended double ridged guide vs. the biconical and log-periodic antenna
Author :
Leferink, Frank B J ; Boerle, Dick J Groot
Author_Institution :
Environ. Test Lab., Hollandse Signaalapparaten BV, Hengelo, Netherlands
Volume :
1
fYear :
1998
fDate :
24-28 Aug 1998
Firstpage :
339
Abstract :
International civil standards require the generation of a reasonable constant field strength over a large area. In this paper it is shown that the dipole-like biconical and log-periodic antennas are less favourable compared to double ridged guide antennas. Due to the near field antenna pattern of the dipole-like antennas, considerable power is radiated to the floor and walls of a shielded enclosure. Although the floor and walls are covered by absorbing material, these absorbers are not performing well in the near field of antennas resulting in a high standing wave ratio of the antenna. Due to the high standing wave ratio the antennas present a low efficiency and poor quality of the field. A double ridged guide antenna has less sidelobes, higher gain and is less influenced by the floor and walls of a shielded enclosure. An extended double ridged guide antenna, extending the frequency range of classic double ridged guide antennas (200 MHz-1 GHz) to 80 MHz up to 1 GHz, has been developed and presented in this paper. The theoretical background and practically obtained results are shown
Keywords :
antenna radiation patterns; antenna theory; electromagnetic shielding; horn antennas; 80 MHz to 1 GHz; absorbing material; antenna theory; biconical antenna; dipole-like antennas; extended double ridged guide antennas; high field strength; high standing wave ratio; log-periodic antenna; near field antenna pattern; shielded enclosure; Antenna measurements; Antenna theory; Dipole antennas; Equations; Frequency; Immunity testing; Log periodic antennas; Polarization; Reflector antennas; Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-5015-4
Type :
conf
DOI :
10.1109/ISEMC.1998.750113
Filename :
750113
Link To Document :
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