Title :
Comparison of symbolic analysis, approximation and macromodeling techniques for statistical design for quality of analog integrated circuits
Author :
Styblinski, M.A. ; Qu, Ming
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fDate :
30 Apr-3 May 1995
Abstract :
A comparison of symbolic analysis, approximation and macromodeling techniques for statistical circuit design is presented in this paper. The applicability of these techniques for statistical design of analog integrated circuits is stressed through practical examples. Difficulties and open problems are also discussed with emphasis on statistical circuit design
Keywords :
analogue integrated circuits; circuit analysis computing; circuit optimisation; design for manufacture; integrated circuit design; integrated circuit yield; statistical analysis; tolerance analysis; analog integrated circuits; design for quality; macromodeling techniques; open problems; statistical circuit design; symbolic analysis; tolerance design; yield optimisation; Analog circuits; Analog integrated circuits; Circuit analysis; Circuit optimization; Circuit simulation; Circuit synthesis; Design for quality; Equations; Minimization; SPICE;
Conference_Titel :
Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2570-2
DOI :
10.1109/ISCAS.1995.523869
