Title :
Evaluation of system polarization quality for polarimetric SAR imagery and target decomposition
Author :
Wang, Yanting ; Ainsworth, Thomas L. ; Lee, Jong-Sen
Author_Institution :
Remote Sensing Div., Naval Res. Lab., Washington, DC, USA
Abstract :
The quality of polarimetric synthetic aperture radar (PolSAR) imagery and its polarimetric decompositions depends on the accuracy of polarimetric observations of the SAR system and its calibration. Polarization distortions on the polarimetric measurement can be incurred due to nonideal system polarization quality and propagation factors, such as channel imbalance, cross-talk, and Faraday rotation at lower frequencies. All these distortions have varying impacts on different target types as well as different decomposition methods. In this paper, we assess the polarization quality of the PolSAR system in the context of polarimetric imagery analysis and quantify the various effects of polarization distortions on polarization target decompositions. A generic metric is defined to measure the polarization purity of the system. Considering the fact that target decomposition plays an important role in imagery analysis, we apply several widely used decomposition methods to showcase the polarimetric system requirement based on the defined metric.
Keywords :
polarisation; radar imaging; radar polarimetry; synthetic aperture radar; Faraday rotation; PolSAR imagery; SAR system; channel imbalance; cross-talk; nonideal system polarization quality; polarimetric SAR imagery; polarimetric decompositions; polarimetric imagery analysis; polarimetric measurement; polarimetric observations; polarimetric synthetic aperture radar; polarimetric system requirement; polarization distortions; polarization purity; polarization target decompositions; propagation factors; Calibration; Distortion measurement; Faraday effect; Measurement errors; Remote sensing; Scattering; calibration; radar polarimetry; synthetic aperture radar; target decomposition;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2010.5652141