Title :
Long term reliability of mass-produced high-efficiency silicon point-contact solar cells under 250× concentration
Author :
Slade, Alexander ; Gordon, Robert ; Dutra, David ; Garboushian, Vahan
Author_Institution :
Amonix Inc., Torrance, CA, USA
Abstract :
The paper will present efficiency results of high concentration silicon solar cells that were measured before and after 30 months of exposure to ∼ 25 W/cm2 sunlight. It is concluded that a process developed by Amonix Inc. provides UV stability to point-contact silicon solar cells under ∼ 25 W/cm2 for prolonged periods. Efficiency results are presented for individual solar cells and for modules made up of 24 series-connected solar cells. In particular, the modules are generally over 22.5% efficient at PVUSA conditions, if the optical losses of the lens are excluded.
Keywords :
elemental semiconductors; semiconductor device measurement; semiconductor device reliability; silicon; solar cells; ultraviolet radiation effects; 22.5 percent; 30 month; Si; UV stability; efficiency; high concentration silicon solar cells; long term reliability; silicon point-contact solar cells; sunlight exposure; Costs; Degradation; Foundries; Manufacturing processes; Optical surface waves; Photovoltaic cells; Production; Semiconductor device manufacture; Silicon; State feedback;
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
Print_ISBN :
0-7803-7471-1
DOI :
10.1109/PVSC.2002.1190777
