DocumentCode :
3345521
Title :
Comparison of substrate finishes for flip chip packages
Author :
Bansal, Anurag ; Yoon, Sam ; Xie, John ; Li, Yuan ; Mahadev, Vadali
Author_Institution :
Altera Corp., San Jose, CA, USA
fYear :
2005
fDate :
31 May-3 June 2005
Firstpage :
30
Abstract :
In order to achieve substrate routing densities required for high pin count flip chip package, electroless nickel immersion gold (ENIG) substrates have been the technology of choice. However, ENIG substrates are found to be more susceptible to brittle fracture at the nickel to intermetallic interface during high strain rate events. This mode has been sporadically found in PCB assembly and handling operations involving excessive and uncontrolled flexural loads on the PC boards. The unpredictable nature of this failure mode has driven suppliers to look for alternatives to ENIG. In this paper, electrolytic nickel-gold and solder on pad (SOP) are studied and contrasted against ENIG. A significant outcome of this work is the identification of a viable surface finish with improved toughness to withstand mechanical shocks in early assembly and with continued good long term reliability.
Keywords :
ball grid arrays; flip-chip devices; reliability; substrates; surface finishing; electroless nickel immersion gold substrate; flexural loads; flip chip packages; intermetallic interface; reliability; solder on pad; strain; substrate finish; substrate routing; Assembly; Capacitive sensors; Electric shock; Flip chip; Gold; Intermetallic; Nickel; Packaging; Routing; Surface finishing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2005. Proceedings. 55th
ISSN :
0569-5503
Print_ISBN :
0-7803-8907-7
Type :
conf
DOI :
10.1109/ECTC.2005.1441241
Filename :
1441241
Link To Document :
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