DocumentCode :
3345576
Title :
Effective sinogram-inpainting for metal artifacts reduction in X-ray CT images
Author :
Kim, Youngshin ; Yoon, Seongbeak ; Yi, Juneho
Author_Institution :
Comput. Vision Lab., Sungkyunkwan Univ., Suwon, South Korea
fYear :
2010
fDate :
26-29 Sept. 2010
Firstpage :
597
Lastpage :
600
Abstract :
This research features a new idea for effective sinogram inpainting that boosts the MAR (metal artifacts reduction) performance. We have indentified neighbor pixels that are relevant to the target pixel to be inpainted and only used these pixels in determining an inpainting value. Experimental results show that our methods based on the proposed idea significantly reduce inpainting errors, enhancing the MAR performance. They can be incorporated into any sinogram-inpainting based MAR algorithms.
Keywords :
X-ray microscopy; computerised tomography; image reconstruction; metals; MAR algorithm; MAR performance; X-ray CT image; inpainting value; metal artifacts reduction; sinogram-inpainting; Arrays; Computed tomography; Detectors; Metals; Pixel; RNA; X-ray imaging; Metal artifacts reduction; Sinogram-inpainting; X-ray CT imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
ISSN :
1522-4880
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2010.5652149
Filename :
5652149
Link To Document :
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