Title :
A Wireless Thin Contact Stress Sensor Based on Surface Acoustic Wave Resonator in ZnO/Si Structure
Author :
Chen, Dong ; Ding, Jiexiong ; Du, Li ; Liu, Guangmin ; He, Jianguo
Author_Institution :
Sch. of Mechatron. Eng., UESTC, Chengdu, China
Abstract :
A sensor based on surface acoustic wave resonator (SAWR) in ZnO/Si structure for wirelessly monitoring contact stress in thin gap is analyzed. Firstly, the scheme of SAWR stress sensor and surface effective permittivity for analyzing SAW in ZnO/Si structure are introduced. Then, the phase velocity and electromechanical coupling coefficient for Rayleigh mode as well as Sezawa mode are obtained in ZnO/Si structure. Next, the stress sensitivity of the sensor is estimated by combing changed elastic constants with surface effective permittivity for the Sezawa mode. The results show that the sensor exhibits good linear relation between applied stress and relative frequency shift with the adjustable stress sensitivity for different thickness of diaphragm. Finally, the temperature sensitivity of the stress sensor is estimated to -31 ppm/ °C for temperatures ranging from 20 to 60 °C. To reduce temperature disturbance, a differential measurement configuration is presented.
Keywords :
II-VI semiconductors; computerised monitoring; condition monitoring; elastic constants; mechanical contact; permittivity; stress analysis; surface acoustic wave resonators; surface acoustic wave sensors; wide band gap semiconductors; zinc compounds; Rayleigh mode; SAWR stress sensor; Sezawa mode; ZnO-Si; diaphragm thickness; differential measurement configuration; elastic constants; electromechanical coupling coefficient; phase velocity; stress sensitivity; surface acoustic wave resonator; surface effective permittivity; temperature disturbance; temperature sensitivity; wireless monitoring; wireless thin contact stress sensor; Sensitivity; Silicon; Strain; Stress; Substrates; Surface acoustic waves; Zinc oxide; SAWR; ZnO/Si; contact stress; wireless;
Conference_Titel :
Instrumentation, Measurement, Computer, Communication and Control, 2011 First International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-4519-6
DOI :
10.1109/IMCCC.2011.22