• DocumentCode
    3345689
  • Title

    Effect of Intermetallics Spalling on the Mechanical Behavior of Electroless Ni(P)/Pb-Free Solder Interconnection

  • Author

    Sohn, Yoon-Chul ; Yu, Jin ; Kang, Sung K. ; Shih, Da-Yuan ; Lee, Taek-Yeong

  • fYear
    2005
  • fDate
    May 31 2005-June 3 2005
  • Firstpage
    83
  • Lastpage
    88
  • Keywords
    Gold; Integrated circuit interconnections; Intermetallic; Metallization; Printed circuits; Soldering; Surface cracks; Surface finishing; Testing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2005. Proceedings. 55th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-8907-7
  • Type

    conf

  • DOI
    10.1109/ECTC.2005.1441250
  • Filename
    1441250