• DocumentCode
    3345745
  • Title

    Thermionic emission model for interface effects on the open-circuit voltage of amorphous silicon based solar cells

  • Author

    Schiff, E.A.

  • Author_Institution
    Dept. of Phys., Syracuse Univ., NY, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    1086
  • Lastpage
    1089
  • Abstract
    We present computer modeling for effects of the p/i interface upon the open-circuit voltage Voc in amorphous silicon based pin solar cells. We show that the modeling is consistent with measurements on the intensity-dependence for the interface effect, and we present an interpretation for the modeling based on thermionic emission of electrons over the electrostatic barrier at the p/i interface. We present additional modeling of the relation of Voc with the intrinsic layer bandgap EG. The experimental correlation for optimized cells is Voc = (EG/e)-0.79. The correlation is simply explained if Voc in these calls is determined by the intrinsic layer, and in particular by the (variable) bandgap and by a non-varying valence bandtail width (about 48 meV) of this layer.
  • Keywords
    amorphous semiconductors; elemental semiconductors; semiconductor device models; silicon; solar cells; thermionic electron emission; Si; amorphous silicon based solar cells; bandgap; intensity-dependence; interface effects; open-circuit voltage; p/i interface; thermionic emission model; Amorphous silicon; Computer interfaces; Electron emission; Electrostatic measurements; Lighting; Photonic band gap; Photovoltaic cells; Physics; Thermionic emission; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190794
  • Filename
    1190794