DocumentCode :
3345745
Title :
Thermionic emission model for interface effects on the open-circuit voltage of amorphous silicon based solar cells
Author :
Schiff, E.A.
Author_Institution :
Dept. of Phys., Syracuse Univ., NY, USA
fYear :
2002
fDate :
19-24 May 2002
Firstpage :
1086
Lastpage :
1089
Abstract :
We present computer modeling for effects of the p/i interface upon the open-circuit voltage Voc in amorphous silicon based pin solar cells. We show that the modeling is consistent with measurements on the intensity-dependence for the interface effect, and we present an interpretation for the modeling based on thermionic emission of electrons over the electrostatic barrier at the p/i interface. We present additional modeling of the relation of Voc with the intrinsic layer bandgap EG. The experimental correlation for optimized cells is Voc = (EG/e)-0.79. The correlation is simply explained if Voc in these calls is determined by the intrinsic layer, and in particular by the (variable) bandgap and by a non-varying valence bandtail width (about 48 meV) of this layer.
Keywords :
amorphous semiconductors; elemental semiconductors; semiconductor device models; silicon; solar cells; thermionic electron emission; Si; amorphous silicon based solar cells; bandgap; intensity-dependence; interface effects; open-circuit voltage; p/i interface; thermionic emission model; Amorphous silicon; Computer interfaces; Electron emission; Electrostatic measurements; Lighting; Photonic band gap; Photovoltaic cells; Physics; Thermionic emission; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN :
1060-8371
Print_ISBN :
0-7803-7471-1
Type :
conf
DOI :
10.1109/PVSC.2002.1190794
Filename :
1190794
Link To Document :
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