Title :
Multi-channel and High-precision Parallel Transient Interruption Test Technology
Author :
Bigui, Dong ; Xu, Liang ; Deshun, Yan
Author_Institution :
Sch. of Autom. Sci. & Electr. Eng., Beihang Univ., Beijing, China
Abstract :
Transient interruption is a common failure phenomenon which is the key factor influencing the contact reliability of connectors. This paper analyzes the failure process and characteristics of transient interruption, and presents a multi-channel and high precision parallel test technology. The transient interruption test system designed in the paper can effectively realize the detection of transient interruption and has been applied to the practical project.
Keywords :
electric connectors; electrical contacts; failure analysis; testing; transient analysis; connectors; contact reliability; failure phenomenon process; high-precision parallel transient interruption test technology; multichannel test technology; Connectors; Contact resistance; Field programmable gate arrays; Hardware; Interrupters; Resistance; Transient analysis; contact reliability; parallel processing; transient interruption;
Conference_Titel :
Instrumentation, Measurement, Computer, Communication and Control, 2011 First International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-4519-6
DOI :
10.1109/IMCCC.2011.42
