DocumentCode
3345905
Title
Multi-channel and High-precision Parallel Transient Interruption Test Technology
Author
Bigui, Dong ; Xu, Liang ; Deshun, Yan
Author_Institution
Sch. of Autom. Sci. & Electr. Eng., Beihang Univ., Beijing, China
fYear
2011
fDate
21-23 Oct. 2011
Firstpage
133
Lastpage
136
Abstract
Transient interruption is a common failure phenomenon which is the key factor influencing the contact reliability of connectors. This paper analyzes the failure process and characteristics of transient interruption, and presents a multi-channel and high precision parallel test technology. The transient interruption test system designed in the paper can effectively realize the detection of transient interruption and has been applied to the practical project.
Keywords
electric connectors; electrical contacts; failure analysis; testing; transient analysis; connectors; contact reliability; failure phenomenon process; high-precision parallel transient interruption test technology; multichannel test technology; Connectors; Contact resistance; Field programmable gate arrays; Hardware; Interrupters; Resistance; Transient analysis; contact reliability; parallel processing; transient interruption;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation, Measurement, Computer, Communication and Control, 2011 First International Conference on
Conference_Location
Beijing
Print_ISBN
978-0-7695-4519-6
Type
conf
DOI
10.1109/IMCCC.2011.42
Filename
6153977
Link To Document