• DocumentCode
    3345929
  • Title

    Fabrication of graphene devices for infrared detection

  • Author

    Lai, King Wai Chiu ; Fung, Carmen Kar Man ; Chen, Hongzhi ; Yang, Ruiguo ; Ong, Bo Song ; Xi, Ning

  • Author_Institution
    Electr. & Comput. Eng. Dept., Michigan State Univ., East Lansing, MI, USA
  • fYear
    2010
  • fDate
    12-15 Oct. 2010
  • Firstpage
    14
  • Lastpage
    17
  • Abstract
    Researchers have been looking for novel materials to improve the performance of photonic devices. Graphene has great potential to optoelectronic applications because of its excellent optical properties. Here, we demonstrate using the graphene-based photodetectors for infrared detection under a zero-bias operation. We have demonstrated to use an electric-field-assisted method to manipulate graphene flake between metal microelectrodes successfully without the electron beam lithography. The devices are made from few-layer-graphene and multi-layer-graphene which are confirmed by Raman spectroscopy and atomic force microscopy. The size of the graphene flake can be as large as 15 μm × 15 μm. The obtained results demonstrate high potential applications of the electric-field-assisted technique and nano assembly to fabricate graphene-based infrared photodetectors.
  • Keywords
    Raman spectroscopy; atomic force microscopy; graphene; infrared detectors; microelectrodes; optoelectronic devices; photodetectors; C; Raman spectroscopy; atomic force microscopy; electric-field-assisted method; few-layer-graphene; graphene device fabrication; graphene flake; graphene-based photodetector; infrared detection; metal microelectrode; multilayer-graphene; optoelectronic application; photonic device; zero-bias operation; Force; Metals; Microelectrodes; Microscopy; Nanoscale devices; Photoconductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-8896-4
  • Type

    conf

  • DOI
    10.1109/NMDC.2010.5652175
  • Filename
    5652175