DocumentCode :
3346021
Title :
Partial pre-applied underfill for assembly and reliability of Pb-free CSPs
Author :
Morganelli, Paul ; Shah, Jayesh ; Wheelock, Brian ; Mohan, Vinod ; Laffey, Matthew
Author_Institution :
Emerson & Cuming Specialty Polymers, Billerica, MA, USA
fYear :
2005
fDate :
31 May-3 June 2005
Firstpage :
223
Abstract :
A novel pre-applied underfill is presented. In this approach, a B-staged thermoset is applied to a chip-scale package (CSP) as a thin layer over the solder bump array. During reflow, the coating expands to fill the standoff gap between the PCB and package, providing reinforcement to the solder joints. The underfill material is stable at typical drying and burn-in conditions, allowing it to be applied early in the manufacturing process. The expanded underfill was found to improve drop impact resistance significantly relative to a non-underfilled CSP.
Keywords :
assembling; chip scale packaging; coatings; impact (mechanical); integrated circuit reliability; polymers; reflow soldering; B-staged thermoset; CSP; Pb; assembly; chip-scale package; drop impact resistance; manufacturing process; pre-applied underfill; reflow soldering; reliability; solder bump array; solder joints; Assembly; Biological materials; Cellular phones; Chip scale packaging; Coatings; Electronics packaging; Manufacturing processes; Moisture; Polymers; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2005. Proceedings. 55th
ISSN :
0569-5503
Print_ISBN :
0-7803-8907-7
Type :
conf
DOI :
10.1109/ECTC.2005.1441270
Filename :
1441270
Link To Document :
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