DocumentCode :
3346048
Title :
High-rate microcrystalline silicon for solar cells
Author :
Smit, C. ; Korevaar, B.A. ; Petit, A.M.H.N. ; van Swaaij, R.A.C.M.M. ; Kessels, W.M.M. ; van de Sanden, M.C.M.
Author_Institution :
Dept. of Appl. Phys., Eindhoven Univ. of Technol., Netherlands
fYear :
2002
fDate :
19-24 May 2002
Firstpage :
1170
Lastpage :
1173
Abstract :
In order to produce thin silicon films for solar cells at high growth rates we deposited films with a cascaded arc expanding thermal plasma. We demonstrate the power of this technique by applying amorphous films deposited at rates up to 1.4 nm/s in solar cells. We used the same deposition technique to produce microcrystalline silicon films. Growth rates up to 3.7 nm/s are achieved. The material structure is analyzed using Raman spectroscopy and XRD. We see that the crystalline fraction increases with the H2 flow, whereas the amorphous and the void fraction decrease.
Keywords :
Raman spectra; X-ray diffraction; crystal microstructure; elemental semiconductors; plasma CVD coatings; semiconductor growth; semiconductor thin films; silicon; solar cells; μc-Si films; Raman spectroscopy; Si; XRD; cascaded arc expanding thermal plasma; deposition technique; high growth rates; high-rate microcrystalline Si; solar cells; void fraction; Amorphous materials; Crystalline materials; Photovoltaic cells; Plasma materials processing; Raman scattering; Semiconductor films; Silicon; Spectroscopy; Thermal expansion; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN :
1060-8371
Print_ISBN :
0-7803-7471-1
Type :
conf
DOI :
10.1109/PVSC.2002.1190815
Filename :
1190815
Link To Document :
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