Title :
Enhanced performance of self-assembled Ge-dots in Si thin film solar cells
Author :
Presting, H. ; Konle, J. ; Kibbel, H. ; Uebele, P. ; Strobl, G.
Author_Institution :
DaimlerChrysler Res. Center, Ulm, Germany
Abstract :
Germanium (Ge)-islands have been deposited by MBE on silicon (Si)-substrates to enhance the efficiency of Si thin film solar cells. The islands are deposited in the Stranski-Krastanow growth mode on a standard 10Ωcm, p-type Si substrate and form the base of the solar cell. We employed Sb as surfactant to achieve rather high island densities (>1011 cm-2, typical lateral width 20nm and heights 3nm). Up to 75 Ge layers with 8 monolayers (ML) Ge each separated by a thin (9nm-18nm) undoped Si buffer layer have been stacked on top of each other. On top of it we deposited 200nm undoped Si layer into which we performed an n+ emitter diffusion. Preliminary measurements show a reduced open circuit voltage but an enhancement of the short circuit current in the infrared regime with an efficiency of about 12%.
Keywords :
elemental semiconductors; germanium; self-assembly; semiconductor device measurement; semiconductor quantum dots; silicon; solar cells; 10 ohmcm; 12 percent; 20 nm; 200 nm; 3 nm; 9 to 18 nm; MBE; Si thin film solar cells; Si-Ge; Stranski-Krastanow growth mode; efficiency; enhanced performance; germanium-islands; open circuit voltage; self-assembled Ge-dots; short circuit current; surfactant; Buffer layers; Circuits; Current measurement; Germanium; Molecular beam epitaxial growth; Photovoltaic cells; Semiconductor thin films; Silicon; Sputtering; Substrates;
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
Print_ISBN :
0-7803-7471-1
DOI :
10.1109/PVSC.2002.1190822