DocumentCode :
3347020
Title :
Commonly observed degradation in field-aged photovoltaic modules
Author :
Quintana, M.A. ; King, D.L. ; McMahon, T.J. ; Osterwald, C.R.
fYear :
2002
fDate :
19-24 May 2002
Firstpage :
1436
Lastpage :
1439
Abstract :
Degradation leading to failure in photovoltaic modules follows a progression that is dependent on multiple factors, some of which interact causing degradation that is difficult to simulate in the lab. This paper defines observed degradation in field-aged modules, including degradation of packaging materials, adhesional loss, degradation of interconnects, degradation due to moisture intrusion, and semiconductor device degradation. Additionally, this paper suggests that the onset and progression of degradation need to be studied to gain a more comprehensive understanding of module degradation rates and module failures.
Keywords :
adhesion; failure analysis; interconnections; moisture; packaging; semiconductor devices; solar cell arrays; adhesional loss; field-aged photovoltaic modules; interconnects degradation; module degradation rates; module failures; moisture intrusion; packaging materials; photovoltaic modules degradation; photovoltaic modules failure; semiconductor device degradation; Conducting materials; Degradation; Laboratories; Moisture; Performance loss; Photovoltaic systems; Renewable energy resources; Semiconductor device packaging; Semiconductor materials; Solar power generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN :
1060-8371
Print_ISBN :
0-7803-7471-1
Type :
conf
DOI :
10.1109/PVSC.2002.1190879
Filename :
1190879
Link To Document :
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