DocumentCode :
3347040
Title :
Design and Development of True-CSP
Author :
Kanth, Kolan Ravi ; Poh, Francis K S ; Lim, B.K. ; Chong, Desmond Y R ; Sun, Anthony ; Tan, H.B.
fYear :
2005
fDate :
May 31 2005-June 3 2005
Firstpage :
577
Lastpage :
582
Keywords :
Assembly; Chip scale packaging; Copper; Encapsulation; Printing; Silicon; Stress; Strips; Testing; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2005. Proceedings. 55th
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-8907-7
Type :
conf
DOI :
10.1109/ECTC.2005.1441326
Filename :
1441326
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3347040