• DocumentCode
    3347235
  • Title

    Reducing the measurement footprint in the characterization of low-loss materials using the flanged-waveguide measurement geometry

  • Author

    Hyde, M.W., IV ; Havrilla, M.J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Air Force Inst. of Technol., Dayton, OH, USA
  • fYear
    2010
  • fDate
    20-24 Sept. 2010
  • Firstpage
    43
  • Lastpage
    46
  • Abstract
    The purpose of this paper is to demonstrate how the flanged-waveguide material-characterization technique, originally designed to characterize lossy materials only, can be extended to accurately extract permittivity and permeability of low-loss materials. Provided in this paper is a summary of the flanged-waveguide technique. This is followed by a discussion of how time-domain gating can be utilized to mitigate the error introduced by waves reflected from the edges of the flanges. Furthermore, it is demonstrated that by utilizing time-domain gating, the cross-sectional dimensions of the flanges can be significantly reduced. Lastly, material measurement results of plexiglass are provided to validate the time-domain gating technique.
  • Keywords
    flanges; magnetic permeability measurement; permittivity measurement; rectangular waveguides; time-domain analysis; cross-sectional dimension; flanged-waveguide material characterization; flanged-waveguide measurement geometry; low-loss material permeability; low-loss material permittivity; measurement footprint; plexiglass; time-domain gating; Book reviews; Logic gates; Materials; Permeability; Permittivity; Permittivity measurement; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetics in Advanced Applications (ICEAA), 2010 International Conference on
  • Conference_Location
    Sydney, NSW
  • Print_ISBN
    978-1-4244-7366-3
  • Type

    conf

  • DOI
    10.1109/ICEAA.2010.5652258
  • Filename
    5652258