Title :
Measurement of fine-structure changing collision in ultracold /sup 85/Rb held in a MOT
Author :
Marcassa, L. ; Zanon, R. ; Bagnato, V.S. ; Dutta, S. ; Weiner, J. ; Dulieu, O.
Author_Institution :
Inst. de Fisica de Sao Carlos, Sao Paulo Univ., Brazil
Abstract :
Summary form only given. In a magneto-optical trap (MOT) two main mechanisms contribute to the total trap loss rate. Radiative escape (RE), where the spontaneous emission within the collision duration transforms internal energy into kinetic motion. Fine-structure changing collision (FSC) is an exoergic process where a pair of excited ground state atoms undergoes a change to the lower state of the fine-structure doublet, followed by a release of /spl Delta/E/sub FSC//2 in kinetic energy normally enough to eject the atoms from the trap. In earlier experiments only the total trap loss rate, which is the sum of contributions from RE and FSC, was determined. Distinguishing between these two mechanisms is important because it allows a more precise comparison with the theory, leading to a better understanding of exoergic cold collisions. In this experiment the FSC contribution to the total loss in /sup 85/Rb is measured by direct photoionization of the P/sub 1/2/ fragments.
Keywords :
atom-atom collisions; atomic clocks; fine structure; ground states; laser cooling; photoionisation; radiation pressure; rubidium; spontaneous emission; Doppler profile; Rb; direct photoionization; excited ground state atoms; exoergic cold collisions; fine-structure changing collision; fine-structure doublet; kinetic energy; magneto-optical trap; radiative escape; spontaneous emission; total trap loss rate; ultracold /sup 85/Rb; Atom lasers; Atomic beams; Atomic measurements; Frequency; Kinetic theory; Laser transitions; Laser tuning; Power capacitors; Stationary state; Velocity measurement;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-576-X
DOI :
10.1109/QELS.1999.807357