DocumentCode :
3348176
Title :
Pb-free Assembly, Rework, and Reliability Analysis of IPC Class 2 Assemblies
Author :
Gleason, Jerry ; Reynolds, Charlie ; Bath, Jasbir ; Chu, Quyen ; Kelly, Matthew ; Lyjak, Ken ; Roubaud, Patrick
Author_Institution :
HP, Palo Alto, CA
fYear :
2005
fDate :
May 31 2005-June 3 2005
Firstpage :
959
Lastpage :
969
Abstract :
A team of NEMI companies collaborated for three years to develop Pb-free assembly and rework processes for double-sided, 14-layer, printed circuit boards (PCB) in two thicknesses (0.093" and 0.135") with electrolytic NiAu and immersion Ag surface finishes. This work followed the initial SMT manufacturing feasibility effort carried out by the first NEMI Pb-free development team (1999-2002). All SMT assembly, PTH wave assembly and component rework processes were carried out on production equipment. Various test vehicles including the reliability test board were used in a multiphase development project to develop Pb-free assembly and rework parameters and temperature profiles prior to a 100-board process technology verification build. Following the double-sided SMT and wave assembly build, half of the printed circuits assemblies were passed through a series of representative component rework protocols. Each build group was then subjected to a series of mechanical and thermal reliability stress tests, including 5700 cycles of 0 to 100degC, followed by failure analysis. A special test board was designed utilizing a high temperature laminate designed for Pb-free soldering. Approximately 30% of the assemblies were SnPb control samples. This paper will present the Pb-free SMT assembly and rework development process using the NEMI Sn3.9Ag0.6Cu solder, and results of the reliability stress tests. The rework of large, thick PCB\´s with Pb-free solder poses a significant challenge to the industry. The lesson\´s learned and recommendations for future work will be discussed
Keywords :
assembling; copper alloys; failure analysis; nickel alloys; printed circuit manufacture; printed circuit testing; silver alloys; solders; stress analysis; surface mount technology; tin alloys; 0 to 100 C; Ag; IPC class 2 assemblies; NiAu; PTH wave assembly; Pb-free assembly; SMT assembly; Sn3.9Ag0.6Cu; component rework processes; component rework protocols; double-sided printed circuit boards; electrolytic surface finishes; failure analysis; immersion surface finishes; mechanical reliability; printed circuits assemblies; production equipment; reliability analysis; reliability test board; stress tests; surface mount technology; temperature profiles; thermal reliability; Assembly; Circuit testing; Collaborative work; Manufacturing; Printed circuits; Production equipment; Surface finishing; Surface-mount technology; Temperature; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2005. Proceedings. 55th
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-8907-7
Type :
conf
DOI :
10.1109/ECTC.2005.1441388
Filename :
1441388
Link To Document :
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