Third-order susceptibility measurement in silica-based thin film by Zernicke imaging technique

Summary form only given. It has been shown that the modification undergone by the image given by a Young two-slit object in a 4-f system, in presence of a nonlinear medium, can be used to measure the nonlinear refractive index n/sub 2/ in various materials. Experimental and theoretical descriptions are reported in detail. Here, we give a brief summary of this method, the so-called Zernicke imaging technique (ZIT).