DocumentCode
3348189
Title
Performance measurement for a new low dark count UV-SiPM
Author
Bérard, Philippe ; Couture, Martin ; Deschamps, Pierre ; Laforce, Frédéric ; Dautet, Henri
Author_Institution
Excelitas Technol., Vaudreuil, QC, Canada
fYear
2011
fDate
23-29 Oct. 2011
Firstpage
544
Lastpage
547
Abstract
Solid state detectors operating in Geiger mode such as the silicon photomultiplier (SiPM) are poised to replace currently used photomultiplier tubes in many applications due to their robustness, dimension and magnetic insensibility. A next generation SiPM well suited for near UV photons with low dark count rate has been developed. 1 mm, 3 mm and 5 mm devices with 25, 50 and 100 μm micro-cells and geometrical efficiencies ranging from 29% to 74% have been produced. A probability of detection of 58% in photon counting mode at 440 nm has been reached. The photon detection efficiency (PDE) thus ranges from 42% to 17% depending on the geometrical efficiency of the chip. The dark count rate varied between the different designs (25 μm to 100 μm micro-cells, 1 mm to 5 mm chips) and was in the region of 300 kcps per mm2 at room temperature and at an operating voltage maximizing the PDE. Characteristics from this novel low dark count SiPM design will be presented and compared, further developments and improvements will also be discussed.
Keywords
Geiger counters; photomultipliers; photon counting; probability; silicon radiation detectors; solid-state nuclear track detectors; ultraviolet detectors; Geiger mode; PDE; detection probability; geometrical efficiency; low dark count SiPM design; low dark count ultraviolet-SiPM; magnetic insensibility; microcells; photomultiplier tubes; photon counting mode; photon detection efficiency; silicon photomultiplier; solid state detectors; ultraviolet photons; wavelength 100 mum; wavelength 25 mum; wavelength 440 nm; wavelength 50 mum; Calibration; Crosstalk; Optical character recognition software; Performance evaluation; Photonics;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location
Valencia
ISSN
1082-3654
Print_ISBN
978-1-4673-0118-3
Type
conf
DOI
10.1109/NSSMIC.2011.6154109
Filename
6154109
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