DocumentCode
3348210
Title
Molecular dynamics simulation of lead free solder for low temperature reflow applications
Author
Dong, Hai ; Fan, Lianhua ; Moon, Kyoung-Sik ; Wong, C.P. ; Baskes, M.I.
Author_Institution
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2005
fDate
31 May-3 June 2005
Firstpage
983
Abstract
The modified embedded atom method (MEAM) was employed in conjunction with molecular dynamics (MD) simulations to investigate whether a physical mixture of nano Sn and nano Ag particles at a prescribed ratio would achieve the same intermixing as a nano Sn/Ag alloy. A Sn sphere and a Ag sphere both with a diameter of 4 nm were prepared by cutting the perfect bulk lattice structure. After energy minimization and structural relaxation, the two spheres were placed next to each other with a gap of 3 Å. The simulation was then performed at 500 K for 3000 ps. Simulation results showed that nano Ag sphere still maintained its crystalline structure and no significant diffusion between Sn and Ag was observed. Based on the time frame involved in simulation (3 ns), the results implied that a physical mixture of nano Sn and nano Ag particles may not suffice the requirements of lead free solder for low temperature reflow applications.
Keywords
crystal structure; low-temperature techniques; molecular dynamics method; nanoparticles; reflow soldering; silver alloys; solders; tin alloys; 3 Å; 500 K; Ag; Sn; bulk lattice structure; crystalline structure; energy minimization; lead free solder; low temperature reflow applications; modified embedded atom method; molecular dynamics simulation; nano Ag particles; nano Sn particles; nano Sn/Ag alloy; structural relaxation; Computational modeling; Environmentally friendly manufacturing techniques; Gallium alloys; Integrated circuit interconnections; Laboratories; Lead; Materials science and technology; Moon; Temperature sensors; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2005. Proceedings. 55th
ISSN
0569-5503
Print_ISBN
0-7803-8907-7
Type
conf
DOI
10.1109/ECTC.2005.1441391
Filename
1441391
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