DocumentCode
3348317
Title
The characterization of insulating materials using triangular signals of very high period
Author
Neagu, Eugen R. ; Neagu, Rodica M. ; Pissis, Polycarpos ; Das-Gupta, Dilip K.
Author_Institution
Dept. of Phys., Tech. Univ. of Iasi, Romania
fYear
1996
fDate
25-30 Sep 1996
Firstpage
585
Lastpage
590
Abstract
A triangular symmetric signal of very high period is employed for the measurement of electrical properties at very low frequency. The response of an insulating material to such a signal is analyzed to determine dielectric properties including the complex permittivity, relaxation frequency and the dynamic resistance. The obtained values for dielectric permittivity are in good agreement with the values obtained in ac measurements. The dynamic resistance of the sample is small compared with the dc value. The passing from one polarization mechanism to another appears as a change in the slope of the measured current and so the charge responsible for a particular mechanism can be determined. The accumulation of space charge inside the sample is indicated by distortion of the signal. From the shape of the current at low fields it is concluded that the metal-dielectric contact is ohmic
Keywords
dielectric measurement; dielectric polarisation; dielectric relaxation; electric resistance measurement; insulation testing; permittivity; polyethylene insulation; polymer films; space charge; PET films; complex permittivity; dielectric properties; dynamic resistance; electrical properties; insulating materials characterization; ohmic metal-dielectric contact; polarization mechanism; relaxation frequency; signal distortion; space charge; triangular symmetric signal; very high period triangular signals; very low frequency measurement; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Electric resistance; Electric variables measurement; Electrical resistance measurement; Frequency measurement; Permittivity measurement; Polarization; Signal analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets, 1996. (ISE 9), 9th International Symposium on
Conference_Location
Shanghai
Print_ISBN
0-7803-2695-4
Type
conf
DOI
10.1109/ISE.1996.578168
Filename
578168
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