• DocumentCode
    3348317
  • Title

    The characterization of insulating materials using triangular signals of very high period

  • Author

    Neagu, Eugen R. ; Neagu, Rodica M. ; Pissis, Polycarpos ; Das-Gupta, Dilip K.

  • Author_Institution
    Dept. of Phys., Tech. Univ. of Iasi, Romania
  • fYear
    1996
  • fDate
    25-30 Sep 1996
  • Firstpage
    585
  • Lastpage
    590
  • Abstract
    A triangular symmetric signal of very high period is employed for the measurement of electrical properties at very low frequency. The response of an insulating material to such a signal is analyzed to determine dielectric properties including the complex permittivity, relaxation frequency and the dynamic resistance. The obtained values for dielectric permittivity are in good agreement with the values obtained in ac measurements. The dynamic resistance of the sample is small compared with the dc value. The passing from one polarization mechanism to another appears as a change in the slope of the measured current and so the charge responsible for a particular mechanism can be determined. The accumulation of space charge inside the sample is indicated by distortion of the signal. From the shape of the current at low fields it is concluded that the metal-dielectric contact is ohmic
  • Keywords
    dielectric measurement; dielectric polarisation; dielectric relaxation; electric resistance measurement; insulation testing; permittivity; polyethylene insulation; polymer films; space charge; PET films; complex permittivity; dielectric properties; dynamic resistance; electrical properties; insulating materials characterization; ohmic metal-dielectric contact; polarization mechanism; relaxation frequency; signal distortion; space charge; triangular symmetric signal; very high period triangular signals; very low frequency measurement; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Electric resistance; Electric variables measurement; Electrical resistance measurement; Frequency measurement; Permittivity measurement; Polarization; Signal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 1996. (ISE 9), 9th International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-2695-4
  • Type

    conf

  • DOI
    10.1109/ISE.1996.578168
  • Filename
    578168