DocumentCode :
3348317
Title :
The characterization of insulating materials using triangular signals of very high period
Author :
Neagu, Eugen R. ; Neagu, Rodica M. ; Pissis, Polycarpos ; Das-Gupta, Dilip K.
Author_Institution :
Dept. of Phys., Tech. Univ. of Iasi, Romania
fYear :
1996
fDate :
25-30 Sep 1996
Firstpage :
585
Lastpage :
590
Abstract :
A triangular symmetric signal of very high period is employed for the measurement of electrical properties at very low frequency. The response of an insulating material to such a signal is analyzed to determine dielectric properties including the complex permittivity, relaxation frequency and the dynamic resistance. The obtained values for dielectric permittivity are in good agreement with the values obtained in ac measurements. The dynamic resistance of the sample is small compared with the dc value. The passing from one polarization mechanism to another appears as a change in the slope of the measured current and so the charge responsible for a particular mechanism can be determined. The accumulation of space charge inside the sample is indicated by distortion of the signal. From the shape of the current at low fields it is concluded that the metal-dielectric contact is ohmic
Keywords :
dielectric measurement; dielectric polarisation; dielectric relaxation; electric resistance measurement; insulation testing; permittivity; polyethylene insulation; polymer films; space charge; PET films; complex permittivity; dielectric properties; dynamic resistance; electrical properties; insulating materials characterization; ohmic metal-dielectric contact; polarization mechanism; relaxation frequency; signal distortion; space charge; triangular symmetric signal; very high period triangular signals; very low frequency measurement; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Electric resistance; Electric variables measurement; Electrical resistance measurement; Frequency measurement; Permittivity measurement; Polarization; Signal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets, 1996. (ISE 9), 9th International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-2695-4
Type :
conf
DOI :
10.1109/ISE.1996.578168
Filename :
578168
Link To Document :
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