Title :
Progress in PV technology development under the New Sunshine Program JFY1997-2000-PV system technology
Author :
Kato, Kazuhiko ; Nobue, Yutaka ; Yokoda, Tetsu ; Hayashi, Fumiaki ; Yamada, Masaharu ; Yamada, Kazuhiro ; Shino, Kiyoshi ; Ogawa, Ken-Ichiro
Author_Institution :
Solar & Wind Energy Dept., New Energy & Ind. Technol. Dev. Organ., Tokyo, Japan
Abstract :
The second half of R&D project on photovoltaic (PV) technology under the ´New Sunshine Program´ terminated at the end of JFY2000 with fruitful and satisfactory technological achievements. A variety of R&D activities on PV system technology as well as solar cells were carried out in this project technology development of measuring performance and long-term reliability of solar cells and modules, monitoring and analysis of PV system performance, development of irradiation database for designing PV systems, development of building-integrated PV modules (BIPV), technology development of durable lead-acid battery for PV system, demonstrative research on multiple PV grid connection and control technologies and so on. In this paper, outcomes of these R&D activities on PV system technology are summarized, and a new NEDO 5-year R&D project on PV system technology, which started in JFY2001 based on the fruits of the ´New Sunshine Program´, is briefly introduced.
Keywords :
building integrated photovoltaics; lead acid batteries; photovoltaic power systems; power generation reliability; research and development management; solar cell arrays; solar cells; NEDO 5-year R&D project; New Sunshine Program; PV system technology; PV technology development; R&D project; control technologies; lead-acid battery; long-term reliability measurement; multiple PV grid connection; performance measurement; solar cells; Battery charge measurement; Building integrated photovoltaics; Databases; Monitoring; Performance analysis; Photovoltaic cells; Photovoltaic systems; Research and development; Solar power generation; System performance;
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
Print_ISBN :
0-7803-7471-1
DOI :
10.1109/PVSC.2002.1190952