DocumentCode
3348443
Title
Using PDMS Micro-Transfer Moulding for Polymer Flip Chip Packaging on MEMS
Author
Chan, Edward K L ; Wong, Cell K Y ; Lee, M. ; Yuen, Matthew M F ; Yi-Kuen Lee
Author_Institution
Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon
fYear
2005
fDate
May 31 2005-June 3 2005
Firstpage
1071
Lastpage
1076
Abstract
Polymer flip chip process utilizes Ag filled thermoset and/or thermoplastic polymers, in combination with stencil printing processes to form polymer bump interconnects of flip chip IC devices (Estes, 1998). Nevertheless, slumping behavior of conventional polymer interconnect material during bumping process on the wafer chip has constrained the bump height achieved by the most common stencil printing to 50mum (Kulesza et al., 1997). A bumping process to form fine pitch, high aspect ratio polymer flip chip bumps without slumping was developed by producing a through-hole PDMS micro-transfer mould on a metallized wafer (Wong, et al., 2003). In this paper, a MEMS chip (Lee, et al., 2003) was packaged by the PDMS micro-transfer mould technique to evaluate the performance of the interconnection method. Flip chip assembly process was then performed on the printed circuit board (PCB) and some functionality tests was conducted afterwards. The designed dimension of the polymer bump is 150mum in diameter, 90mum in height, and at a 245mum pitch. Bump adhesion force was measured and found to be about 40gram. Electrical conductivity test was also conducted after PCB assembly as preliminary reliability test of the whole assembly process. Results showed that the MEMS chip was functioning well with new polymer bumping method. With this bumping approach, intrinsic slumping problem of the conductive polymer paste is resolved. This low temperature fabrication technique is an important development for MEMS packaging
Keywords
fine-pitch technology; flip-chip devices; integrated circuit interconnections; micromechanical devices; polymers; transfer moulding; 150 micron; 90 micron; MEMS; PDMS microtransfer moulding; bump adhesion force; bumping process; electrical conductivity; flip chip assembly; polymer bump interconnects; polymer flip chip packaging; printed circuit board; stencil printing; thermoplastic polymers; thermoset; Assembly; Circuit testing; Flip chip; Force measurement; Integrated circuit interconnections; Metallization; Micromechanical devices; Packaging; Polymers; Printing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2005. Proceedings. 55th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
0-7803-8907-7
Type
conf
DOI
10.1109/ECTC.2005.1441404
Filename
1441404
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