Title :
Novel method for measuring Dicke narrowing by wavelength modulation spectroscopy
Author :
Dharamsi, A.N. ; Bullock, A.M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Old Dominion Univ., Norfolk, VA, USA
Abstract :
Summary form only given. Wavelength modulation spectroscopy signals exhibit features of frequency derivatives of the lineshape profile. Detection at the modulation frequency, f, yields signals that approximate the first derivative, and detection at the frequency Nf yields a signal that approximates the N/sup th/ derivative. Second harmonic (2f) detection has been used frequently in the past, while we have recently demonstrated several advantages of higher harmonic detection. These include an increased sensitivity to density fluctuations, and an increased resolution of overlapping lines.
Keywords :
fluctuations; modulation spectroscopy; optical harmonic generation; optical resolving power; sensitivity; spectral line narrowing; Dicke narrowing; density fluctuation; frequency derivatives; higher harmonic detection; increased resolution; lineshape profile; modulation frequency detection; overlapping lines; second harmonic detection; sensitivity; wavelength modulation spectroscopy; wavelength modulation spectroscopy signals; Absorption; Counting circuits; Electronic mail; Fluctuations; Frequency modulation; Oxygen; Pressure measurement; Signal resolution; Spectroscopy; Wavelength measurement;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-576-X
DOI :
10.1109/QELS.1999.807427