Title :
Influence of tip fields on NSOM imaging
Author :
Bryant, G.W. ; Ansheng Liu
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Summary form only given. Near-field scanning optical microscopy (NSOM) is being studied intensively to achieve optical spatial resolution much better than the diffraction limit. Modeling able to reproduce images and identify essential features in image formation is required. We describe several approaches that we have used, including the discrete dipole method and the multiple multipole method, to model scattering of nanometer-scale tip fields by nanometer-scale samples. NSOM images obtained from well-characterized experiments are simulated. Experimental and simulated images are compared to separate the contributions from tip-field structure, sample scattering, and mutual interaction and provide a clearer image interpretation.
Keywords :
image resolution; light diffraction; light scattering; near-field scanning optical microscopy; optical images; NSOM; NSOM images; NSOM imaging; diffraction limit; discrete dipole method; image formation; image interpretation; multiple multipole method; nanometer-scale samples; nanometer-scale tip fields; near-field scanning optical microscopy; optical spatial resolution; sample scattering; simulated images; tip fields; tip-field structure; Chemistry; Diffraction; Electrostatic precipitators; Fluorescence; Focusing; Geometry; Lenses; Lighting; Microscopy; Physics;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-576-X
DOI :
10.1109/QELS.1999.807432
