• DocumentCode
    3348625
  • Title

    Solder-Free Pressure Contact Micro-Springs in High-Density Flip-Chip Packages

  • Author

    Chow, Eugene M. ; Chua, Chris ; Hantschel, Thomas ; Van Schuylenbergh, Koenraad ; Fork, David K.

  • Author_Institution
    Palo Alto Res. Center, CA
  • fYear
    2005
  • fDate
    May 31 2005-June 3 2005
  • Firstpage
    1119
  • Lastpage
    1126
  • Abstract
    This work investigates electrical pressure contacts based on a micro-spring with orders of magnitude smaller pitch and force than conventional pressure contacts. Flip-chip packages were assembled with hundreds of micro-springs at 20 mum pad-pitch, 40 mum spring-pitch, and an operating force of 0.01 gram on gold pads. These packages are shown to have stable resistance values during both in-situ thermocycle (0 degC to 125 degC) and humidity testing (60 degC at 95% RH). High-speed glitch measurements are performed to confirm the pressure contact does not have intermittent opens during thermocycling. These results suggest that a low-force solder-free pressure spring contact is a viable technology for next generation flip-chip packaging
  • Keywords
    electrical contacts; flip-chip devices; micromechanical devices; 0 to 125 C; 20 micron; 40 micron; electrical pressure contact; flip-chip packages; gold pad; high-speed glitch measurement; humidity testing; in-situ thermocycle; solder-free pressure contact microspring; thermocycling; Assembly; Contacts; Electrical resistance measurement; Gold; Humidity; Packaging; Performance evaluation; Pressure measurement; Testing; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2005. Proceedings. 55th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-8907-7
  • Type

    conf

  • DOI
    10.1109/ECTC.2005.1441413
  • Filename
    1441413