DocumentCode :
3348951
Title :
Frequency and Temperature Dependence of Dielectric Constant of Epoxy/BaTiO3 Composite Embedded Capacitor Films (ECFs) for Organic Substrate
Author :
Hyun, Jin-Gul ; Lee, Sangyong ; Cho, Sung-Dong ; Paik, Kyung-Wook
Author_Institution :
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon
fYear :
0
fDate :
0-0 0
Firstpage :
1241
Lastpage :
1247
Abstract :
In this study, temperature dependence of capacitance, one of the most important properties of ECFs, was investigated. Temperature dependence of ECFs capacitance was determined by temperature dependence of dielectric constant and thickness, and among these, main factor was dielectric constant of ECFs. Dielectric constant of ECFs is determined by that of epoxy and BaTiO3 powders. Below 130degC, dielectric constant of ECFs increased as temperature increased, and was mainly affected by an epoxy matrix. However, above 130degCs the Curie temperature of BaTiO3, the increase rate of ECFs dielectric constant started decreasing, because BaTiO3 powder undergoes a phase transition from a tetragonal to a cubic structure and its dielectric constant decreases at 130degC. Dielectric constant of BaTiO 3 powder was obtained from measured dielectric constants of ECF and applying the Lichtenecker logarithmic rule. Dielectric constants of ECFs at high frequency range (0.1~10GHz) were measured using a cavity resonance method. For both powders, dielectric constants in high frequency range were about 3/4 of the dielectric constants at 1 MHz. This difference is mainly due to the decrease of dielectric constant of epoxy matrix. For BaTiO3 ECFs, there was a dielectric relaxation at 5~9GHz presumably due to the polarization mode change of BaTiO3 powder
Keywords :
barium compounds; ceramics; composite materials; dielectric relaxation; dielectric thin films; permittivity; polymers; powders; titanium compounds; 0.1 to 10 GHz; 5 to 9 GHz; BaTiO3; BaTiO3 powders; Curie temperature; Lichtenecker logarithmic rule; cavity resonance method; cubic structure; dielectric constant; dielectric relaxation; dielectric thickness; embedded capacitor films; epoxy matrix; epoxy/BaTiO3 composite; frequency dependence; organic substrate; phase transition; polymer/ceramic composite; temperature dependence; tetragonal structure; Capacitance; Capacitors; Dielectric constant; Dielectric measurements; Dielectric substrates; Frequency measurement; High-K gate dielectrics; Powders; Resonance; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2005. Proceedings. 55th
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-8907-7
Type :
conf
DOI :
10.1109/ECTC.2005.1441429
Filename :
1441429
Link To Document :
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