• DocumentCode
    3348951
  • Title

    Frequency and Temperature Dependence of Dielectric Constant of Epoxy/BaTiO3 Composite Embedded Capacitor Films (ECFs) for Organic Substrate

  • Author

    Hyun, Jin-Gul ; Lee, Sangyong ; Cho, Sung-Dong ; Paik, Kyung-Wook

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    1241
  • Lastpage
    1247
  • Abstract
    In this study, temperature dependence of capacitance, one of the most important properties of ECFs, was investigated. Temperature dependence of ECFs capacitance was determined by temperature dependence of dielectric constant and thickness, and among these, main factor was dielectric constant of ECFs. Dielectric constant of ECFs is determined by that of epoxy and BaTiO3 powders. Below 130degC, dielectric constant of ECFs increased as temperature increased, and was mainly affected by an epoxy matrix. However, above 130degCs the Curie temperature of BaTiO3, the increase rate of ECFs dielectric constant started decreasing, because BaTiO3 powder undergoes a phase transition from a tetragonal to a cubic structure and its dielectric constant decreases at 130degC. Dielectric constant of BaTiO 3 powder was obtained from measured dielectric constants of ECF and applying the Lichtenecker logarithmic rule. Dielectric constants of ECFs at high frequency range (0.1~10GHz) were measured using a cavity resonance method. For both powders, dielectric constants in high frequency range were about 3/4 of the dielectric constants at 1 MHz. This difference is mainly due to the decrease of dielectric constant of epoxy matrix. For BaTiO3 ECFs, there was a dielectric relaxation at 5~9GHz presumably due to the polarization mode change of BaTiO3 powder
  • Keywords
    barium compounds; ceramics; composite materials; dielectric relaxation; dielectric thin films; permittivity; polymers; powders; titanium compounds; 0.1 to 10 GHz; 5 to 9 GHz; BaTiO3; BaTiO3 powders; Curie temperature; Lichtenecker logarithmic rule; cavity resonance method; cubic structure; dielectric constant; dielectric relaxation; dielectric thickness; embedded capacitor films; epoxy matrix; epoxy/BaTiO3 composite; frequency dependence; organic substrate; phase transition; polymer/ceramic composite; temperature dependence; tetragonal structure; Capacitance; Capacitors; Dielectric constant; Dielectric measurements; Dielectric substrates; Frequency measurement; High-K gate dielectrics; Powders; Resonance; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2005. Proceedings. 55th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-8907-7
  • Type

    conf

  • DOI
    10.1109/ECTC.2005.1441429
  • Filename
    1441429