DocumentCode
334898
Title
A high resolution electron beam profile monitor
Author
Graves, W.S. ; Johnson, E.D.
Author_Institution
Nat. Synchrotron Light Source, Brookhaven Nat. Lab., Upton, NY
Volume
2
fYear
1997
fDate
12-16 May 1997
Firstpage
1993
Abstract
A new beam diagnostic to measure transverse profiles of electron beams is described. This profile monitor uses a Yttrium:Aluminum:Garnet (YAG) crystal doped with a visible-light scintillator to produce an image of the transverse beam distribution. The advantage of this material over traditional fluorescent screens is that it is formed from a single crystal, and therefore has improved spatial resolution. The current system is limited to a resolution of about 10 microns. Improvements in the optical transport will enable measurements of RMS beam sizes of less than 1 micron. The total cost of the system is modest
Keywords
electron beams; particle beam diagnostics; RMS beam size; YAG; YAG crystal; YAl5O12; electron beams; spatial resolution; transverse beam distribution; transverse profile; Cameras; Crystals; Electrical resistance measurement; Electron beams; Fluorescence; Grain size; Monitoring; Size measurement; Spatial resolution; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 1997. Proceedings of the 1997
Conference_Location
Vancouver, BC
Print_ISBN
0-7803-4376-X
Type
conf
DOI
10.1109/PAC.1997.751084
Filename
751084
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