Title :
A high resolution electron beam profile monitor
Author :
Graves, W.S. ; Johnson, E.D.
Author_Institution :
Nat. Synchrotron Light Source, Brookhaven Nat. Lab., Upton, NY
Abstract :
A new beam diagnostic to measure transverse profiles of electron beams is described. This profile monitor uses a Yttrium:Aluminum:Garnet (YAG) crystal doped with a visible-light scintillator to produce an image of the transverse beam distribution. The advantage of this material over traditional fluorescent screens is that it is formed from a single crystal, and therefore has improved spatial resolution. The current system is limited to a resolution of about 10 microns. Improvements in the optical transport will enable measurements of RMS beam sizes of less than 1 micron. The total cost of the system is modest
Keywords :
electron beams; particle beam diagnostics; RMS beam size; YAG; YAG crystal; YAl5O12; electron beams; spatial resolution; transverse beam distribution; transverse profile; Cameras; Crystals; Electrical resistance measurement; Electron beams; Fluorescence; Grain size; Monitoring; Size measurement; Spatial resolution; Testing;
Conference_Titel :
Particle Accelerator Conference, 1997. Proceedings of the 1997
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-4376-X
DOI :
10.1109/PAC.1997.751084
