DocumentCode :
3349099
Title :
Nanostructured VO2 film coatings for tunable MEMS resonators
Author :
Merced, Emmanuelle ; Cabrera, Rafmag ; Suarez, Ramón ; Fernández, Félix E. ; Sepúlveda, Nelson
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Puerto Rico, Mayaguez, PR, USA
fYear :
2010
fDate :
12-15 Oct. 2010
Firstpage :
212
Lastpage :
215
Abstract :
This paper reports measurements of the electrical resistance and resonant frequency of VO2-coated silicon dioxide (SiO2) bridges when the coating´s insulator-to-metal transition (IMT) is thermally induced by conduction. The measurements of these two properties were done simultaneously. The decrease in electrical resistance was close to three orders in magnitude. The resonant frequency shift across the IMT started with an increase of 1.5% for temperatures in the “cold end” of the IMT, followed by a decrease of 20% for temperatures in the “hot end” of the IMT.
Keywords :
electrical resistivity; frequency measurement; metal-insulator transition; micromechanical resonators; nanostructured materials; silicon compounds; thin films; vanadium compounds; VO2-SiO2; electrical resistance measurements; insulator-to-metal transition; nanostructured film coatings; resonant frequency measurements; tunable MEMS resonators; Bridges; Films; Frequency measurement; Micromechanical devices; Resistance; Resonant frequency; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-8896-4
Type :
conf
DOI :
10.1109/NMDC.2010.5652371
Filename :
5652371
Link To Document :
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