Low intensity beam diagnostics with microchannel plate detectors

Author

Cuttone, G. ; De Martinis, C. ; Finocchiaro, P. ; Giove, D. ; Raia, G. ; Rovelli, A.

Author_Institution

LNS, Ist. Nazionale di Fisica Nucl., Catania, Italy

Volume

2

fYear

1997

fDate

12-16 May 1997

Firstpage

2038

Abstract

A non destructive low intensity ion beam profile monitor has been designed and tested. The system is based on a MCP that detects the residual gas ionization produced by the ion beam. The detector is coupled to a phosphorous screen for the readout of the vertical and horizontal density profiles. Experimental results have shown that the system is able to detect beam intensities as low as 10⁸ pps with a local vacuum in the measuring box of the order of 8×10^-6 mbar. In the paper we report the results so far obtained in beam sensitivity and measure precision as a function of the residual pressure and in different regimes of the detector

Keywords

microchannel plates; particle beam diagnostics; position sensitive particle detectors; 0.000008 mbar; beam diagnostics; beam sensitivity; ion beam profile monitor; microchannel plate detectors; phosphorous screen; pressure; Electron beams; Ion beams; Ionization; Microchannel; Monitoring; Optical coupling; Optical sensors; Particle beams; Vacuum systems; Windows;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1997. Proceedings of the 1997

Conference_Location

Vancouver, BC

Print_ISBN

0-7803-4376-X

Type

conf

DOI

10.1109/PAC.1997.751099

Filename

751099