• DocumentCode
    3349148
  • Title

    High accuracy measurement technology of CCD and its industrial application

  • Author

    Hao, Pengfei ; Zhang, Xiaodong ; Li, Yuanzong ; Zheng, Lihong

  • Author_Institution
    Coll. of Mech. Eng., Taiyuan Univ. of Technol., Taiyuan
  • fYear
    2008
  • fDate
    21-24 Sept. 2008
  • Firstpage
    423
  • Lastpage
    429
  • Abstract
    This paper introduces a subpixel measuring method for industry dimension measurement. The new point is high accurate edge point location which is to use spatial moments to estimate the exact location of edge within a pixel. The proposed method includes of camera calibration, image preprocessing, edge detection, subpixel location and dimension obtain. In practical, there are many factors which affect the measurement result. Noise may play key role. In order to eliminate the noise effect on measurement, meanwhile, to keep it from expanding and save the details of image edge, a nonlinear filter algorithm is proposed. Furthermore, subdivision technology based on spatial moment help to improve accuracy of edge location. Real time industrial measure results have demonstrated that high accuracy dimensional measurement technology could reach the accuracy index whose maximum measure error less than 0.01 mm. Therefore, this new method can be further developed and applied in many kinds of real time applications.
  • Keywords
    CCD image sensors; edge detection; CCD; camera calibration; edge detection; high accuracy measurement technology; high accurate edge point location; image preprocessing; industry dimension measurement; nonlinear filter algorithm; spatial moments; subpixel location; subpixel measuring method; Area measurement; Calibration; Cameras; Charge coupled devices; Charge-coupled image sensors; Image edge detection; Image processing; Mechanical variables measurement; Nonlinear filters; Paper technology; calibration of camera; industrial measurement; subpixel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cybernetics and Intelligent Systems, 2008 IEEE Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-1673-8
  • Electronic_ISBN
    978-1-4244-1674-5
  • Type

    conf

  • DOI
    10.1109/ICCIS.2008.4670737
  • Filename
    4670737