Title :
Extended Fault Analysis on Elliptic Curve Cryptosystems against Repeated Doubling
Author :
Yingzhan, Kou ; Jinzhong, Zhang ; Bo, Wan ; Ping, Zhou
Author_Institution :
Dept. of Comput. Eng., Ordnance Eng. Coll., Shijiazhuang, China
Abstract :
This paper constitutes a fault model on elliptic curve cryptosystems against repeated doubling based on the principle of sign change fault attacks, and presents an improved fault analysis method which can effectively solve the "zero block failure" problem. We attack the elliptic curve cryptosystems with binary method, fixed window method, and also sliding window method in this way. The simulation experiments demonstrate: 15-16 times fault injections are enough to recover full 192-bits key. Because of having similar repeated doubling, the method presented here can provide some ideas for fault attack on other public key cryptosystems.
Keywords :
failure analysis; public key cryptography; binary method; elliptic curve cryptosystems; extended fault analysis method; fixed window method; public key cryptosystems; repeated doubling; sign change fault attacks; sliding window method; zero block failure problem; Algorithm design and analysis; Computational efficiency; Elliptic curve cryptography; Elliptic curves; elliptic curve cryptosystems; fault attacks; public key cryptography; repeated doubling; zero block failure;
Conference_Titel :
Instrumentation, Measurement, Computer, Communication and Control, 2011 First International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-4519-6
DOI :
10.1109/IMCCC.2011.141