DocumentCode
3349445
Title
Ellipsoidal Tolerances Analysis Ensuring Product Yield Probability
Author
Voropay, Olexiy
Author_Institution
Zaporizhzhya Nat. Tech. Univ., Zaporizhzhya
fYear
2007
fDate
19-24 Feb. 2007
Firstpage
351
Lastpage
353
Abstract
A method of probabilistic tolerances analysis under normal distribution of input parameters and given product yield probability is offered. Output function deviations are found in points of its minimal and maximal values in bounds of tolerances domain, which approximated by multidimensional ellipsoid. Its size is selected proportionally to normalized normal inverse distribution.
Keywords
integrated circuit layout; normal distribution; tolerance analysis; ellipsoidal tolerances analysis; multidimensional ellipsoid; normal inverse distribution; product yield probability; tolerances domain; Axles; Cost function; Ellipsoids; Frequency estimation; Gaussian distribution; Integral equations; Moment methods; Multidimensional systems; Tellurium; Yield estimation; Ellipsoid; Inverse Distribution; Normal Distribution; Product Yield; Tolerances Analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
CAD Systems in Microelectronics, 2007. CADSM '07. 9th International Conference - The Experience of Designing and Applications of
Conference_Location
Lviv-Polyana
Print_ISBN
966-533-587-0
Type
conf
DOI
10.1109/CADSM.2007.4297577
Filename
4297577
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