Embedded test structures reduce ASIC time-to-market

Author

Sobczak, David M.

Author_Institution

LSI Logic Corp., Waltham, MA, USA

fYear

1991

fDate

23-27 Sep 1991

Lastpage

37773

Abstract

LSI Logic Corporation, using embedded test circuitry developed by CrossCheck Technology Inc., has developed a new compacted array technology known as the LFT150K FasTest Array series. The author gives a brief overview of the LFT150K family, describe the performance impact of the embedded test structures, compare this test scheme with conventional scan methods, and describe the FasTest time-to-market and time-to-volume advantages

Keywords

CMOS integrated circuits; application specific integrated circuits; built-in self test; integrated circuit testing; logic arrays; logic testing; ASIC; CrossCheck Technology; LFT150K FasTest Array series; LSI Logic Corporation; compacted array technology; embedded test circuitry; embedded test structures; Application specific integrated circuits; Circuit faults; Circuit testing; Electronic equipment testing; Large scale integration; Logic arrays; Logic circuits; Logic testing; Probes; Time to market;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International

Conference_Location

Rochester, NY

Print_ISBN

0-7803-0101-3

Type

conf

DOI

10.1109/ASIC.1991.242844

Filename

242844

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3349524