Title :
Experimental studies of metastability behaviors of sub-micron CMOS ASIC flip flops
Author_Institution :
LSI Logic Corp., Milpitas, CA, USA
Abstract :
The author describes the experiment for characterizing metastability performances of sub-micron gate array and cell-based CMOS ASIC flip flops. Basic metastability theory, metastability test circuit, software (flow charts) and hardware set up are discussed. Analyzed experimental results are compared with other technologies
Keywords :
CMOS integrated circuits; application specific integrated circuits; flip-flops; integrated logic circuits; stability; ASIC flip flops; cell-based CMOS; metastability; metastability performances; metastability test circuit; submicron IC; Application specific integrated circuits; Bandwidth; CMOS logic circuits; Circuit testing; Flowcharts; Law; Legal factors; Metastasis; Propagation delay; Tellurium;
Conference_Titel :
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0101-3
DOI :
10.1109/ASIC.1991.242846
