DocumentCode
3349551
Title
Experimental studies of metastability behaviors of sub-micron CMOS ASIC flip flops
Author
Tang, Thomas C.
Author_Institution
LSI Logic Corp., Milpitas, CA, USA
fYear
1991
fDate
23-27 Sep 1991
Lastpage
38078
Abstract
The author describes the experiment for characterizing metastability performances of sub-micron gate array and cell-based CMOS ASIC flip flops. Basic metastability theory, metastability test circuit, software (flow charts) and hardware set up are discussed. Analyzed experimental results are compared with other technologies
Keywords
CMOS integrated circuits; application specific integrated circuits; flip-flops; integrated logic circuits; stability; ASIC flip flops; cell-based CMOS; metastability; metastability performances; metastability test circuit; submicron IC; Application specific integrated circuits; Bandwidth; CMOS logic circuits; Circuit testing; Flowcharts; Law; Legal factors; Metastasis; Propagation delay; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
Conference_Location
Rochester, NY
Print_ISBN
0-7803-0101-3
Type
conf
DOI
10.1109/ASIC.1991.242846
Filename
242846
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